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Results: 1-9 |
Results: 9

Authors: SELINDER TI SJOSTRAND ME NORDIN M LARSSON M OSTLUND A HOGMARK S
Citation: Ti. Selinder et al., PERFORMANCE OF PVD TIN TAN AND TIN/NBN SUPERLATTICE COATED CEMENTED CARBIDE TOOLS IN STAINLESS-STEEL MACHINING/, Surface & coatings technology, 105(1-2), 1998, pp. 51-55

Authors: CAHILL DG LEE SM SELINDER TI
Citation: Dg. Cahill et al., THERMAL-CONDUCTIVITY OF KAPPA-AL2O3 AND ALPHA-AL2O3 WEAR-RESISTANT COATINGS, Journal of applied physics, 83(11), 1998, pp. 5783-5786

Authors: NOWAK ER TAYLOR OW LIU L JAEGER HM SELINDER TI
Citation: Er. Nowak et al., MAGNETIC-FLUX INSTABILITIES IN SUPERCONDUCTING NIOBIUM RINGS - TUNINGTHE AVALANCHE BEHAVIOR, Physical review. B, Condensed matter, 55(17), 1997, pp. 11702-11705

Authors: SELINDER TI MILLER DJ GRAY KE SARDELA MR HULTMAN L
Citation: Ti. Selinder et al., PHASE-FORMATION AND MICROSTRUCTURE OF NB1-XALXN ALLOY-FILMS GROWN ON MGO(001) BY REACTIVE SPUTTERING - A NEW TERNARY PHASE, Vacuum, 46(12), 1995, pp. 1401-1406

Authors: SELINDER TI ROBERTS TA MILLER DJ BENO MA KNAPP GS GRAY KE OGAWA S FAIR JA FRASER DB
Citation: Ti. Selinder et al., IN-SITU X-RAY-DIFFRACTION STUDY OF COSI2 FORMATION DURING ANNEALING OF A CO TI BILAYER ON SI(100)/, Journal of applied physics, 77(12), 1995, pp. 6730-6732

Authors: SELINDER TI MILLER DJ GRAY KE
Citation: Ti. Selinder et al., IN-SITU X-RAY-DIFFRACTION STUDY OF THE ROLE OF ANNEALING AMBIENT IN EPITAXIAL COSI2 GROWTH FROM CO TI BILAYERS ON SI(001)/, Applied physics letters, 67(11), 1995, pp. 1597-1599

Authors: HAN ZH SELINDER TI HELMERSSON U
Citation: Zh. Han et al., FORMATION OF CU-RICH PARTICLES ON THE SURFACE OF YBA2CU3O7-X THIN-FILM GROWN BY IN-SITU OFF-AXIS SPUTTERING, Journal of applied physics, 75(4), 1994, pp. 2020-2025

Authors: HAN ZH HELMERSSON U SELINDER TI
Citation: Zh. Han et al., OBSERVATION OF METALLIC RESISTIVITY BEHAVIOR FOLLOWING A 1 RHO(300-K)DEPENDENCE OF T(C) IN A YBA2CU3O7-X THIN-FILM WITH VARYING OXYGEN DEFICIENCY/, Physical review. B, Condensed matter, 48(10), 1993, pp. 7708-7711

Authors: SELINDER TI HELMERSSON U HAN Z WALLENBERG LR
Citation: Ti. Selinder et al., STRUCTURAL CHARACTERIZATION OF YTTRIA (Y2O3) INCLUSIONS IN YBA2CU3O7-X FILMS - GROWTH-MODEL AND EFFECT ON CRITICAL-CURRENT DENSITY, Thin solid films, 229(2), 1993, pp. 237-248
Risultati: 1-9 |