Authors:
SELINDER TI
SJOSTRAND ME
NORDIN M
LARSSON M
OSTLUND A
HOGMARK S
Citation: Ti. Selinder et al., PERFORMANCE OF PVD TIN TAN AND TIN/NBN SUPERLATTICE COATED CEMENTED CARBIDE TOOLS IN STAINLESS-STEEL MACHINING/, Surface & coatings technology, 105(1-2), 1998, pp. 51-55
Citation: Dg. Cahill et al., THERMAL-CONDUCTIVITY OF KAPPA-AL2O3 AND ALPHA-AL2O3 WEAR-RESISTANT COATINGS, Journal of applied physics, 83(11), 1998, pp. 5783-5786
Authors:
SELINDER TI
MILLER DJ
GRAY KE
SARDELA MR
HULTMAN L
Citation: Ti. Selinder et al., PHASE-FORMATION AND MICROSTRUCTURE OF NB1-XALXN ALLOY-FILMS GROWN ON MGO(001) BY REACTIVE SPUTTERING - A NEW TERNARY PHASE, Vacuum, 46(12), 1995, pp. 1401-1406
Authors:
SELINDER TI
ROBERTS TA
MILLER DJ
BENO MA
KNAPP GS
GRAY KE
OGAWA S
FAIR JA
FRASER DB
Citation: Ti. Selinder et al., IN-SITU X-RAY-DIFFRACTION STUDY OF COSI2 FORMATION DURING ANNEALING OF A CO TI BILAYER ON SI(100)/, Journal of applied physics, 77(12), 1995, pp. 6730-6732
Citation: Ti. Selinder et al., IN-SITU X-RAY-DIFFRACTION STUDY OF THE ROLE OF ANNEALING AMBIENT IN EPITAXIAL COSI2 GROWTH FROM CO TI BILAYERS ON SI(001)/, Applied physics letters, 67(11), 1995, pp. 1597-1599
Citation: Zh. Han et al., FORMATION OF CU-RICH PARTICLES ON THE SURFACE OF YBA2CU3O7-X THIN-FILM GROWN BY IN-SITU OFF-AXIS SPUTTERING, Journal of applied physics, 75(4), 1994, pp. 2020-2025
Citation: Zh. Han et al., OBSERVATION OF METALLIC RESISTIVITY BEHAVIOR FOLLOWING A 1 RHO(300-K)DEPENDENCE OF T(C) IN A YBA2CU3O7-X THIN-FILM WITH VARYING OXYGEN DEFICIENCY/, Physical review. B, Condensed matter, 48(10), 1993, pp. 7708-7711
Authors:
SELINDER TI
HELMERSSON U
HAN Z
WALLENBERG LR
Citation: Ti. Selinder et al., STRUCTURAL CHARACTERIZATION OF YTTRIA (Y2O3) INCLUSIONS IN YBA2CU3O7-X FILMS - GROWTH-MODEL AND EFFECT ON CRITICAL-CURRENT DENSITY, Thin solid films, 229(2), 1993, pp. 237-248