Authors: PEASE RL SHANEYFELT M WINOKUR P FLEETWOOD D GORELICK J MCCLURE S CLARK S COHN L ALEXANDER D

Citation: Rl. Pease et al., MECHANISMS FOR TOTAL-DOSE SENSITIVITY TO PREIRRADIATION THERMAL-STRESS IN BIPOLAR LINEAR MICROCIRCUITS, IEEE transactions on nuclear science, 45(3), 1998, pp. 1425-1430