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Results: 1-3 |
Results: 3
DIRECT SAMPLING TIME-OF-FLIGHT MASS SPECTROMETERS FOR TECHNOLOGICAL ANALYSIS
Authors: SYSOEV AA SYSOEV AA POTESHIN SS PYATAKHIN VI SHCHEKINA IV TROFIMOV AS
Citation: Aa. Sysoev et al., DIRECT SAMPLING TIME-OF-FLIGHT MASS SPECTROMETERS FOR TECHNOLOGICAL ANALYSIS, Fresenius' journal of analytical chemistry, 361(3), 1998, pp. 261-266
GAMMA-RAY SOLID LASER - ION-OPTICAL SYSTEM FOR FAST HIGH-QUALITY FOCUSING OF POWERFUL NON-PARAXIAL ION-BEAMS OF LARGE-FORMAT ENRICHED WITH EXCITED NUCLEI
Authors: SYSOEV AA SHCHEKINA IV KARYAGIN SV
Citation: Aa. Sysoev et al., GAMMA-RAY SOLID LASER - ION-OPTICAL SYSTEM FOR FAST HIGH-QUALITY FOCUSING OF POWERFUL NON-PARAXIAL ION-BEAMS OF LARGE-FORMAT ENRICHED WITH EXCITED NUCLEI, Hyperfine interactions, 107(1-4), 1997, pp. 481-492
LASER TIME-OF-FLIGHT MASS-SPECTROMETER
Authors: SYSOEV AA POTESHIN SS DRYANNOV AI SHCHEKINA IV PYATAKHIN VI MENSHIKOV RA
Citation: Aa. Sysoev et al., LASER TIME-OF-FLIGHT MASS-SPECTROMETER, Instruments and experimental techniques, 40(4), 1997, pp. 508-512
Risultati: 1-3 |