Authors: CHIANG LP ZOUS NK WANG TH CHANG TE SHEN KY HUANG C

Citation: Lp. Chiang et al., FIELD AND TEMPERATURE EFFECTS ON OXIDE CHARGE DETRAPPING IN A METAL-OXIDE-SEMICONDUCTOR FIELD-EFFECT TRANSISTOR BY MEASURING A SUBTHRESHOLDCURRENT TRANSIENT, Applied physics letters, 71(8), 1997, pp. 1068-1070