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Results: 1-8 |
Results: 8
THE SUPERIORITY OF N2O PLASMA ANNEALING OVER O-2 PLASMA ANNEALING FORAMORPHOUS TANTALUM PENTOXIDE (TA2O5) FILMS
Authors: LAU WS PERERA MTC BABU P OW AK HAN T SANDLER NP TUNG CH SHENG TT CHU PK
Citation: Ws. Lau et al., THE SUPERIORITY OF N2O PLASMA ANNEALING OVER O-2 PLASMA ANNEALING FORAMORPHOUS TANTALUM PENTOXIDE (TA2O5) FILMS, JPN J A P 2, 37(4B), 1998, pp. 435-437
OPTICAL-PROPERTIES OF GE SELF-ORGANIZED QUANTUM DOTS IN SI
Authors: PENG CS HUANG Q CHENG WQ ZHOU JM ZHANG YH SHENG TT TUNG CH
Citation: Cs. Peng et al., OPTICAL-PROPERTIES OF GE SELF-ORGANIZED QUANTUM DOTS IN SI, Physical review. B, Condensed matter, 57(15), 1998, pp. 8805-8808
NEW OPTICAL-PROPERTIES OF GE SELF-ORGANIZED QUANTUM DOTS
Authors: PENG CS HUANG Q ZHANG YH CHENG WQ SHENG TT TUNG CH ZHOU JM
Citation: Cs. Peng et al., NEW OPTICAL-PROPERTIES OF GE SELF-ORGANIZED QUANTUM DOTS, Thin solid films, 323(1-2), 1998, pp. 174-177
RELAXED GE0.9SI0.1 ALLOY LAYERS WITH LOW THREADING DISLOCATION DENSITIES GROWN ON LOW-TEMPERATURE SI BUFFERS
Authors: PENG CS ZHAO ZY CHEN H LI JH LI YK GUO LW DAI DY HUANG Q ZHOU JM ZHANG YH SHENG TT TUNG CH
Citation: Cs. Peng et al., RELAXED GE0.9SI0.1 ALLOY LAYERS WITH LOW THREADING DISLOCATION DENSITIES GROWN ON LOW-TEMPERATURE SI BUFFERS, Applied physics letters, 72(24), 1998, pp. 3160-3162
IMPROVEMENT OF GE SELF-ORGANIZED QUANTUM DOTS BY USE OF SB SURFACTANT
Authors: PENG CS HUANG Q CHENG WQ ZHOU JM ZHANG YH SHENG TT TUNG CH
Citation: Cs. Peng et al., IMPROVEMENT OF GE SELF-ORGANIZED QUANTUM DOTS BY USE OF SB SURFACTANT, Applied physics letters, 72(20), 1998, pp. 2541-2543
PRECISION TRANSMISSION ELECTRON-MICROSCOPY SAMPLE PREPARATION USING AFOCUSED ION-BEAM BY EXTRACTION METHOD
Authors: SHENG TT GOH GP TUNG CH WANG LF
Citation: Tt. Sheng et al., PRECISION TRANSMISSION ELECTRON-MICROSCOPY SAMPLE PREPARATION USING AFOCUSED ION-BEAM BY EXTRACTION METHOD, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 15(3), 1997, pp. 610-613
TRANSMISSION ELECTRON-MICROSCOPY ANALYSIS OF BLACK-BELT - THE MASKINGFILM OF WHITE RIBBON OF KOOI EFFECT IN THE LOCAL OXIDATION OF SILICONPROCESS
Authors: SHENG TT LU CY CHANG RD CHIANG ST
Citation: Tt. Sheng et al., TRANSMISSION ELECTRON-MICROSCOPY ANALYSIS OF BLACK-BELT - THE MASKINGFILM OF WHITE RIBBON OF KOOI EFFECT IN THE LOCAL OXIDATION OF SILICONPROCESS, Journal of applied physics, 75(8), 1994, pp. 3810-3813
FROM WHITE RIBBON TO BLACK-BELT - A DIRECT OBSERVATION OF THE KOOI EFFECT MASKING FILM BY TRANSMISSION ELECTRON-MICROSCOPY
Authors: SHENG TT LU CY CHANG RD CHIANG ST
Citation: Tt. Sheng et al., FROM WHITE RIBBON TO BLACK-BELT - A DIRECT OBSERVATION OF THE KOOI EFFECT MASKING FILM BY TRANSMISSION ELECTRON-MICROSCOPY, Journal of the Electrochemical Society, 140(11), 1993, pp. 120000163-120000165
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