Authors: BUZANEVA E VDOVENKOVA T LITVINENKO S MAKHNJUK V STRIKHA V SKRYSHEVSKY V SHEVCHUK P NEMOSHKALENKO V SENKEVICH A SHPAK A

Citation: E. Buzaneva et al., XPS AND AES STUDY OF REACTIVE TI-SI INTERFACE, Journal of electron spectroscopy and related phenomena, 68, 1994, pp. 707-711