ACNP - Italian Periodicals Catalogue

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Results: 10

THE WAVELENGTH-DEPENDENT TRANSFER-FUNCTION FOR OPTICALLY CONTROLLED SEMICONDUCTOR-LASERS

Authors: PARKER MA SHIRE DB

Citation: Ma. Parker et Db. Shire, THE WAVELENGTH-DEPENDENT TRANSFER-FUNCTION FOR OPTICALLY CONTROLLED SEMICONDUCTOR-LASERS, Journal of applied physics, 83(10), 1998, pp. 5056-5060

BISTABLE OPERATION OF COUPLED INPLANE AND OXIDE-CONFINED VERTICAL-CAVITY LASER 1XN ROUTING SWITCHES

Authors: SHIRE DB TANG CL PARKER MA LEI C HODGE L

Citation: Db. Shire et al., BISTABLE OPERATION OF COUPLED INPLANE AND OXIDE-CONFINED VERTICAL-CAVITY LASER 1XN ROUTING SWITCHES, Applied physics letters, 71(21), 1997, pp. 3039-3041

A MODEL FOR OPTICALLY QUENCHED LASERS

Authors: PARKER MA SHIRE DB

Citation: Ma. Parker et Db. Shire, A MODEL FOR OPTICALLY QUENCHED LASERS, Applied physics letters, 70(2), 1997, pp. 146-148

ACCURATE ELECTRON-CYCLOTRON-RESONANCE ETCHING OF SEMICONDUCTOR-LASER HETEROSTRUCTURES USING A SIMPLE LASER REFLECTOMETER

Authors: PARKER MA KIMMET JS MICHALAK RJ WANG HS SHIRE DB TANG CL DRUMHELLER JP

Citation: Ma. Parker et al., ACCURATE ELECTRON-CYCLOTRON-RESONANCE ETCHING OF SEMICONDUCTOR-LASER HETEROSTRUCTURES USING A SIMPLE LASER REFLECTOMETER, IEEE photonics technology letters, 8(6), 1996, pp. 818-820

MULTIPLE-INPUT OPTICAL CONTROL OF VERTICAL-CAVITY SURFACE-EMITTING LASERS USING INTRACAVITY-COUPLED INPLANE LASERS

Authors: SHIRE DB PARKER MA TANG CL

Citation: Db. Shire et al., MULTIPLE-INPUT OPTICAL CONTROL OF VERTICAL-CAVITY SURFACE-EMITTING LASERS USING INTRACAVITY-COUPLED INPLANE LASERS, IEEE photonics technology letters, 8(2), 1996, pp. 188-190

COUPLED INPLANE AND VERTICAL-CAVITY LASER 1XN ROUTING SWITCHES

Authors: SHIRE DB TANG CL HONG M WYNN JD

Citation: Db. Shire et al., COUPLED INPLANE AND VERTICAL-CAVITY LASER 1XN ROUTING SWITCHES, IEEE photonics technology letters, 8(11), 1996, pp. 1537-1539

ETCHED-SURFACE ROUGHNESS MEASUREMENTS FROM AN IN-SITU LASER REFLECTOMETER

Authors: PARKER MA MICHALAK RJ KIMMET JS PIRICH AR SHIRE DB

Citation: Ma. Parker et al., ETCHED-SURFACE ROUGHNESS MEASUREMENTS FROM AN IN-SITU LASER REFLECTOMETER, Applied physics letters, 69(10), 1996, pp. 1459-1461

ELECTRON-CYCLOTRON-RESONANCE ETCHING OF MIRRORS FOR RIDGE-GUIDED LASERS

Authors: SWANSON PD SHIRE DB TANG CL PARKER MA KIMMET JS MICHALAK RJ

Citation: Pd. Swanson et al., ELECTRON-CYCLOTRON-RESONANCE ETCHING OF MIRRORS FOR RIDGE-GUIDED LASERS, IEEE photonics technology letters, 7(6), 1995, pp. 605-607

GAIN CONTROLLED VERTICAL-CAVITY SURFACE-EMITTING LASERS COUPLED WITH INTRACAVITY INPLANE LASERS

Authors: SHIRE DB TANG CL PARKER MA SWANSON PD KIMMET JS

Citation: Db. Shire et al., GAIN CONTROLLED VERTICAL-CAVITY SURFACE-EMITTING LASERS COUPLED WITH INTRACAVITY INPLANE LASERS, Applied physics letters, 66(14), 1995, pp. 1717-1719

HAZARDOUS-WASTE MINIMIZATION IN III-V WAFER FABRICATION PROCESSES

Authors: SHIRE DB

Citation: Db. Shire, HAZARDOUS-WASTE MINIMIZATION IN III-V WAFER FABRICATION PROCESSES, IEEE transactions on components, packaging, and manufacturing technology. Part A, 17(4), 1994, pp. 521-525

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