Citation: T. Sinno et al., POINT-DEFECT DYNAMICS AND THE OXIDATION-INDUCED STACKING-FAULT RING IN CZOCHRALSKI-GROWN SILICON-CRYSTALS, Journal of the Electrochemical Society, 145(1), 1998, pp. 302-318
Citation: T. Sinno et al., ON THE DYNAMICS OF THE OXIDATION-INDUCED STACKING-FAULT RING IN AS-GROWN CZOCHRALSKI SILICON-CRYSTALS, Applied physics letters, 70(17), 1997, pp. 2250-2252