Authors:
LO WK
SKVARLA M
LO CW
CRAIGHEAD HG
ISAACSON MS
Citation: Wk. Lo et al., FIELD-EMISSION PROPERTIES OF SELF-SHIELDED TUNGSTEN SOURCES, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 13(6), 1995, pp. 2441-2444
Authors:
SHANK SM
CHEN FT
SKVARLA M
CRAIGHEAD HG
COOK P
BUSSJAGER R
HAAS F
HONEY DA
Citation: Sm. Shank et al., MULTIPLE-LEVEL PHASE GRATINGS FABRICATED USING FOCUSED ION-BEAM MILLING AND ELECTRON-BEAM LITHOGRAPHY, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 12(6), 1994, pp. 3643-3647
Citation: Jw. Mcnabb et al., REDUCED ELECTRON TRANSMISSION IN AU GAAS DIODES DAMAGED BY FOCUSED ION-BEAM IMPLANTATION STUDIED BY BALLISTIC-ELECTRON-EMISSION MICROSCOPY/, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 12(6), 1994, pp. 3712-3715