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LISTEBARGER J
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HERNER B
PARK H
LAW ME
SIELOFF D
SLINKMAN JA
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LISTEBARGER JK
ROBINSON HG
JONES KS
LAW ME
SIELOFF DD
SLINKMAN JA
SEDGWICK TO
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VOLDMAN SH
GROSS VP
HARGROVE MJ
NEVER JM
SLINKMAN JA
OBOYLE MP
SCOTT TS
DELECKI JJ
Citation: Sh. Voldman et al., SHALLOW TRENCH ISOLATION DOUBLE-DIODE ELECTROSTATIC DISCHARGE CIRCUITAND INTERACTION WITH DRAM OUTPUT CIRCUITRY, Journal of electrostatics, 31(2-3), 1993, pp. 237-262
Citation: Jk. Listebarger et al., USE OF TYPE-II (END OF RANGE) DAMAGE AS DETECTORS FOR QUANTIFYING INTERSTITIAL FLUXES IN ION-IMPLANTED SILICON, Journal of applied physics, 73(10), 1993, pp. 4815-4819