Authors: KRAUSS AR IM J SMENTKOWSKI V SCHULTZ J AUCIELLO O GRUEN DM HOLOCEK J CHANG RPH

Citation: Ar. Krauss et al., ION-BEAM DEPOSITION AND SURFACE CHARACTERIZATION OF THIN MULTICOMPONENT OXIDE-FILMS DURING GROWTH, Materials science & engineering. A, Structural materials: properties, microstructure and processing, 253(1-2), 1998, pp. 221-233

Authors: KRAUSS AR AUCIELLO O IM J SMENTKOWSKI V GRUEN DM IRENE EA CHANG RPH

Citation: Ar. Krauss et al., STUDIES OF FERROELECTRIC FILM GROWTH-PROCESSES USING IN-SITU, REAL-TIME ION-BEAM ANALYSIS, Integrated ferroelectrics, 18(1-4), 1997, pp. 351-368