Authors:
KRAUSS AR
IM J
SMENTKOWSKI V
SCHULTZ J
AUCIELLO O
GRUEN DM
HOLOCEK J
CHANG RPH
Citation: Ar. Krauss et al., ION-BEAM DEPOSITION AND SURFACE CHARACTERIZATION OF THIN MULTICOMPONENT OXIDE-FILMS DURING GROWTH, Materials science & engineering. A, Structural materials: properties, microstructure and processing, 253(1-2), 1998, pp. 221-233
Authors:
KRAUSS AR
AUCIELLO O
IM J
SMENTKOWSKI V
GRUEN DM
IRENE EA
CHANG RPH
Citation: Ar. Krauss et al., STUDIES OF FERROELECTRIC FILM GROWTH-PROCESSES USING IN-SITU, REAL-TIME ION-BEAM ANALYSIS, Integrated ferroelectrics, 18(1-4), 1997, pp. 351-368