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Citation: Wv. Huott et al., ADVANCED MICROPROCESSOR TEST STRATEGY AND METHODOLOGY, IBM journal of research and development, 41(4-5), 1997, pp. 611-627

Authors: KAPUR R PATIL S SNETHEN TJ WILLIAMS TW

Citation: R. Kapur et al., A WEIGHTED RANDOM PATTERN TEST-GENERATION SYSTEM, IEEE transactions on computer-aided design of integrated circuits and systems, 15(8), 1996, pp. 1020-1025