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Results:
1-7
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Results: 7
Authors:
TALUKDER G
SOBHAN MA
HASHEM A
TALUKDER MR
COMISH JCL
JENNINGS P
HEFTER GT
CLARE BW
Citation: G. Talukder et al., INFRARED STUDY OF AS-DEPOSITED SPUTTERED HYDROGENATED AMORPHOUS-SILICON FILMS, Indian Journal of Pure & Applied Physics, 35(9), 1997, pp. 568-573
Authors:
TALUKDER G
SOBHAN MA
HASHEM A
TALUKDER MR
CORNISH JCL
JENNINGS P
HEFTER GT
CLARE BW
Citation: G. Talukder et al., INFRARED STUDY OF SPUTTERED HYDROGENATED AMORPHOUS-SILICON FILMS WITHUNINTENTIONALLY INCORPORATED OXYGEN AND NITROGEN, Indian Journal of Pure & Applied Physics, 35(9), 1997, pp. 574-578
Authors:
SOBHAN MA
KIVAISI RT
STJERNA B
GRANQVIST CG
Citation: Ma. Sobhan et al., THERMOCHROMISM OF SPUTTER-DEPOSITED WXV1-XO2 FILMS, Solar energy materials and solar cells, 44(4), 1996, pp. 451-455
Authors:
AZIZ MA
SOBHAN MA
SAMAD MA
Citation: Ma. Aziz et al., FAST ENUMERATION OF EVERY PATH IN A RELIABILITY GRAPH USING SUBGRAPHS, Microelectronics and reliability, 34(8), 1994, pp. 1395-1396
Authors:
AZIZ MA
SOBHAN MA
SAMAD MA
Citation: Ma. Aziz et al., AN ALGORITHM FOR GENERATION OF REDUNDANT RELIABILITY GRAPHS, Microelectronics and reliability, 34(11), 1994, pp. 1843-1846
Authors:
MOHIUDDIN G
TALUKDER SH
LUTFAR LB
SOBHAN MA
KABIR MK
Citation: G. Mohiuddin et al., UPGRADING OF LOW-GRADE JUTE AND CUTTINGS .3. LARGE-SCALE APPLICATION AND THE PROCESSING OF JUTE FIBERS BY MEANS OF ENZYMES (VOL 83, PG 537,1992), J TEXTILE I, 84(2), 1993, pp. 295-295
Authors:
AZIZ MA
SOBHAN MA
SAMAD MA
Citation: Ma. Aziz et al., EMPIRICAL FORMULAS AND GLOBAL RELIABILITY EVALUATION OF RELIABILITY GRAPHS, Microelectronics and reliability, 33(9), 1993, pp. 1233-1236
Risultati:
1-7
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