Authors:
TALUKDER G
SOBHAN MA
HASHEM A
TALUKDER MR
COMISH JCL
JENNINGS P
HEFTER GT
CLARE BW
Citation: G. Talukder et al., INFRARED STUDY OF AS-DEPOSITED SPUTTERED HYDROGENATED AMORPHOUS-SILICON FILMS, Indian Journal of Pure & Applied Physics, 35(9), 1997, pp. 568-573
Authors:
TALUKDER G
SOBHAN MA
HASHEM A
TALUKDER MR
CORNISH JCL
JENNINGS P
HEFTER GT
CLARE BW
Citation: G. Talukder et al., INFRARED STUDY OF SPUTTERED HYDROGENATED AMORPHOUS-SILICON FILMS WITHUNINTENTIONALLY INCORPORATED OXYGEN AND NITROGEN, Indian Journal of Pure & Applied Physics, 35(9), 1997, pp. 574-578
Citation: Ma. Aziz et al., FAST ENUMERATION OF EVERY PATH IN A RELIABILITY GRAPH USING SUBGRAPHS, Microelectronics and reliability, 34(8), 1994, pp. 1395-1396
Authors:
MOHIUDDIN G
TALUKDER SH
LUTFAR LB
SOBHAN MA
KABIR MK
Citation: G. Mohiuddin et al., UPGRADING OF LOW-GRADE JUTE AND CUTTINGS .3. LARGE-SCALE APPLICATION AND THE PROCESSING OF JUTE FIBERS BY MEANS OF ENZYMES (VOL 83, PG 537,1992), J TEXTILE I, 84(2), 1993, pp. 295-295
Citation: Ma. Aziz et al., EMPIRICAL FORMULAS AND GLOBAL RELIABILITY EVALUATION OF RELIABILITY GRAPHS, Microelectronics and reliability, 33(9), 1993, pp. 1233-1236