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Results:
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Results: 1
DEFECT FORMATION IN SI AND GAAS SINGLE-CR YSTAL WAFERS SUBJECTED TO MECHANICAL TREATMENT
Authors:
KOLEV D MILVIDSKII MG NOVIKOV AG SOKOLOVA NS FOMIN VG
Citation:
D. Kolev et al., DEFECT FORMATION IN SI AND GAAS SINGLE-CR YSTAL WAFERS SUBJECTED TO MECHANICAL TREATMENT, Kristallografia, 42(1), 1997, pp. 141-144
Risultati:
1-1
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