ACNP - Italian Periodicals Catalogue

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Results: 1-12 |

Results: 12

PRESENTAZIONE DI UN NUOVO PROGRAMMA COMPUTERIZZATO PER LA DIAGNOSI IN PSICHIATRIA

Authors: CARRATELLI TJ LANZA AM BONFIGLI C SPAGNOLO R

Citation: Tj. Carratelli et al., PRESENTAZIONE DI UN NUOVO PROGRAMMA COMPUTERIZZATO PER LA DIAGNOSI IN PSICHIATRIA, Psichiatria dell'infanzia e dell'adolescenza , 62(3), 1995, pp. 249-265

NOSOGRAFIA E DIAGNOSI NELLA PSICOPATOLOGIA DELL'ETA' EVOLUTIVA: STUDIO PRELIMINARE

Authors: SPAGNOLO R

Citation: R. Spagnolo, NOSOGRAFIA E DIAGNOSI NELLA PSICOPATOLOGIA DELL'ETA' EVOLUTIVA: STUDIO PRELIMINARE, Psichiatria dell'infanzia e dell'adolescenza , 61(6), 1994, pp. 603-623

THERMAL-PROPERTIES OF POROUS SILICON LAYERS

Authors: BENEDETTO G BOARINO L BRUNETTO N ROSSI A SPAGNOLO R AMATO G

Citation: G. Benedetto et al., THERMAL-PROPERTIES OF POROUS SILICON LAYERS, Philosophical magazine. B. Physics of condensed matter. Statistical mechanics, electronic, optical and magnetic, 76(3), 1997, pp. 383-393

EVALUATION OF THERMAL-CONDUCTIVITY OF POROUS SILICON LAYERS BY A PHOTOACOUSTIC METHOD

Authors: BENEDETTO G BOARINO L SPAGNOLO R

Citation: G. Benedetto et al., EVALUATION OF THERMAL-CONDUCTIVITY OF POROUS SILICON LAYERS BY A PHOTOACOUSTIC METHOD, Applied physics A: Materials science & processing, 64(2), 1997, pp. 155-159

PHOTOTHERMAL AND PHOTOACOUSTIC CHARACTERIZATION OF POROUS SILICON

Authors: AMATO G BENEDETTO G BOARINO L BRUNETTO N SPAGNOLO R

Citation: G. Amato et al., PHOTOTHERMAL AND PHOTOACOUSTIC CHARACTERIZATION OF POROUS SILICON, Optical engineering, 36(2), 1997, pp. 423-431

MEASUREMENT OF THE RESONANCE FREQUENCIES OF A GAS-FILLED ACOUSTIC RESONATOR

Authors: BENEDETTO G GAVIOSO R SPAGNOLO R

Citation: G. Benedetto et al., MEASUREMENT OF THE RESONANCE FREQUENCIES OF A GAS-FILLED ACOUSTIC RESONATOR, Acustica, 82, 1996, pp. 122-122

MODULATED PHOTOTHERMAL REFLECTANCE ON POROUS SILICON

Authors: AMATO G BOARINO L BENEDETTO G SPAGNOLO R

Citation: G. Amato et al., MODULATED PHOTOTHERMAL REFLECTANCE ON POROUS SILICON, Thin solid films, 255(1-2), 1995, pp. 111-114

MEASUREMENT OF MICROPHONE MEMBRANE DISPLACEMENT WITH AN OPTICAL BEAM DEFLECTION TECHNIQUE

Authors: BENEDETTO G GAVIOSO R SPAGNOLO R

Citation: G. Benedetto et al., MEASUREMENT OF MICROPHONE MEMBRANE DISPLACEMENT WITH AN OPTICAL BEAM DEFLECTION TECHNIQUE, Review of scientific instruments, 66(12), 1995, pp. 5563-5566

APPLICATION OF A PHOTOTHERMAL DISPLACEMENT TECHNIQUE FOR THE CHARACTERIZATION OF DIAMOND-LIKE CARBON-FILMS

Authors: AMATO G BENEDETTO G BOARINO L MARINGELLI M SPAGNOLO R

Citation: G. Amato et al., APPLICATION OF A PHOTOTHERMAL DISPLACEMENT TECHNIQUE FOR THE CHARACTERIZATION OF DIAMOND-LIKE CARBON-FILMS, Journal de physique. IV, 4(C7), 1994, pp. 237-240

MODULATED PHOTOTHERMAL REFLECTANCE CHARACTERIZATION OF DOPED SILICON-WAFERS

Authors: BENEDETTO G BOARINO L SPAGNOLO R

Citation: G. Benedetto et al., MODULATED PHOTOTHERMAL REFLECTANCE CHARACTERIZATION OF DOPED SILICON-WAFERS, Physica status solidi. a, Applied research, 146(2), 1994, pp. 777-783

PRIMARY HEMANGIOPERICYTOMA OF BONE - A CASE-REPORT AND LITERATURE-REVIEW (VOL 2, PG 601, 1993)

Authors: SPAGNOLO R TORELLI L BONO B BRUSAMOLINO R BONO A ROSSI N ZURRIDA S

Citation: R. Spagnolo et al., PRIMARY HEMANGIOPERICYTOMA OF BONE - A CASE-REPORT AND LITERATURE-REVIEW (VOL 2, PG 601, 1993), International journal of oncology, 3(1), 1993, pp. 135-135

PHOTOTHERMAL DISPLACEMENT TECHNIQUE - A METHOD TO DETERMINE THE VARIATION OF THERMAL-CONDUCTIVITY VERSUS TEMPERATURE IN SILICON

Authors: BENEDETTO G SPAGNOLO R BOARINO L

Citation: G. Benedetto et al., PHOTOTHERMAL DISPLACEMENT TECHNIQUE - A METHOD TO DETERMINE THE VARIATION OF THERMAL-CONDUCTIVITY VERSUS TEMPERATURE IN SILICON, Review of scientific instruments, 64(8), 1993, pp. 2229-2232

Risultati: 1-12 |