Authors: SPRANCK M KASSENS M REIMER L

Citation: M. Spranck et al., INFLUENCE OF THE ANGULAR-DISTRIBUTION OF BACKSCATTERED ELECTRONS ON SIGNALS AT DIFFERENT TAKE-OFF ANGLES IN LOW-VOLTAGE SCANNING ELECTRON-MICROSCOPY (LVSEM), Scanning, 17(2), 1995, pp. 97-105

Authors: HIRSCH P KASSENS M REIMER L SENKEL R SPRANCK M

Citation: P. Hirsch et al., CONTRAST OF COLLOIDAL GOLD PARTICLES AND THIN-FILMS ON A SILICON SUBSTRATE OBSERVED BY BACKSCATTERED ELECTRONS IN A LOW-VOLTAGE SCANNING ELECTRON-MICROSCOPE, Ultramicroscopy, 50(3), 1993, pp. 263-267