Authors: BENDA V SPUR P KOJECKY B

Citation: V. Benda et al., IMPROVING OF LARGE-AREA GTO HOMOGENEITY BY ELECTRON-IRRADIATION, Microelectronics and reliability, 34(1), 1994, pp. 23-29

Authors: BENDA V SPUR P

Citation: V. Benda et P. Spur, A SIMPLE METHOD OF IN-PROCESS CHECKING OF THE LARGE-AREA GTO HOMOGENEITY, Microelectronics and reliability, 33(10), 1993, pp. 1441-1445