Authors:
SMITH KE
DUDA LC
STAGARESCU CB
DOWNES J
KORAKAKIS D
SINGH R
MOUSTAKAS TD
GUO JH
NORDGREN J
Citation: Ke. Smith et al., SOFT-X-RAY EMISSION STUDIES OF THE BULK ELECTRONIC-STRUCTURE OF ALN, GAN, AND AL0.5GA0.5N, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 16(4), 1998, pp. 2250-2253
Authors:
DUDA LC
GUO JH
NORDGREN J
STAGARESCU CB
SMITH KE
MCCARROLL W
RAMANUJACHARY K
GREENBLATT M
Citation: Lc. Duda et al., SOFT-X-RAY EMISSION AND ABSORPTION STUDY OF THE QUASI-ONE-DIMENSIONALOXIDE CONDUCTORS K0.3MOO3 AND LI0.9MO6O17, Physical review. B, Condensed matter, 56(3), 1997, pp. 1284-1289
Authors:
STAGARESCU CB
DUDA LC
SMITH KE
GUO JH
NORDGREN J
SINGH R
MOUSTAKAS TD
Citation: Cb. Stagarescu et al., ELECTRONIC-STRUCTURE OF GAN MEASURED USING SOFT-X-RAY EMISSION AND ABSORPTION, Physical review. B, Condensed matter, 54(24), 1996, pp. 17335-17338