Authors: KILDEMO M OSSIKOVSKI R STCHAKOVSKY M

Citation: M. Kildemo et al., MEASUREMENT OF THE ABSORPTION-EDGE OF THICK TRANSPARENT SUBSTRATES USING THE INCOHERENT REFLECTION MODEL AND SPECTROSCOPIC UV VISIBLE NEAR IR ELLIPSOMETRY, Thin solid films, 313, 1998, pp. 108-113

Authors: ERNE BH STCHAKOVSKY M OZANAM F CHAZALVIEL JN

Citation: Bh. Erne et al., SURFACE-COMPOSITION OF N-GAAS CATHODES DURING HYDROGEN EVOLUTION CHARACTERIZED BY IN-SITU ULTRAVIOLET-VISIBLE ELLIPSOMETRY AND IN-SITU INFRARED-SPECTROSCOPY, Journal of the Electrochemical Society, 145(2), 1998, pp. 447-456