Authors: PRASAD S LOH W KAPOOR A CHANG E STINE B BONING D CHUNG J

Citation: S. Prasad et al., STATISTICAL METROLOGY FOR CHARACTERIZING CMP PROCESSES, Microelectronic engineering, 33(1-4), 1997, pp. 231-240

Authors: STINE B

Citation: B. Stine, BOOKS FOR YOU - AN ANNOTATED BOOKLIST FOR SENIOR HIGH STUDENTS - CHRISTENBURY,L, JOURNAL OF ADOLESCENT AND ADULT LITERACY, 39(8), 1996, pp. 690-690