Authors:
CHRYSSOULIS SL
STOWE KG
NIEHUIS E
CRAMER HG
BENDEL C
KIM JY
Citation: Sl. Chryssoulis et al., DETECTION OF COLLECTORS ON CONCENTRATOR MINERAL GRAINS BY TIME-OF-FLIGHT SECONDARY-ION MASS-SPECTROMETRY (TOF-SIMS), Transactions - Institution of Mining and Metallurgy. Section C. Mineral processing & extractive metallurgy, 104, 1995, pp. 141-150