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Results: 1-12 |
Results: 12
A HIGH-PRECISION SPECTROMETER FOR THE ABSOLUTE DETERMINATION OF X-RAY-ABSORPTION EDGES AS CALIBRATION STANDARDS
Authors: STUMPEL J BECKER P
Citation: J. Stumpel et P. Becker, A HIGH-PRECISION SPECTROMETER FOR THE ABSOLUTE DETERMINATION OF X-RAY-ABSORPTION EDGES AS CALIBRATION STANDARDS, Nuovo cimento della Societa italiana di fisica. D, Condensed matter,atomic, molecular and chemical physics, biophysics, 19(2-4), 1997, pp. 489-500
VERY HARD DISC
Authors: STUMPEL J
Citation: J. Stumpel, VERY HARD DISC, New scientist, 151(2039), 1996, pp. 51-51
THE VATICAN TAZZA AND OTHER PETRIFICATIONS - AN ICONOLOGICAL ESSAY ONREPLACEMENT AND RITUAL
Authors: STUMPEL J
Citation: J. Stumpel, THE VATICAN TAZZA AND OTHER PETRIFICATIONS - AN ICONOLOGICAL ESSAY ONREPLACEMENT AND RITUAL, Simiolus, 24(2-3), 1996, pp. 111-127
THE PRACTICE OF THEORY -HISTORY - AN EXCHANGE( ART)
Authors: MOXEY K STUMPEL J
Citation: K. Moxey et J. Stumpel, THE PRACTICE OF THEORY -HISTORY - AN EXCHANGE( ART), Simiolus, 24(1), 1996, pp. 85-86
HIGH-RESOLUTION X-RAY-ABSORPTION SPECTROSCOPY WITH ABSOLUTE ENERGY CALIBRATION FOR THE DETERMINATION OF ABSORPTION-EDGE ENERGIES
Authors: KRAFT S STUMPEL J BECKER P KUETGENS U
Citation: S. Kraft et al., HIGH-RESOLUTION X-RAY-ABSORPTION SPECTROSCOPY WITH ABSOLUTE ENERGY CALIBRATION FOR THE DETERMINATION OF ABSORPTION-EDGE ENERGIES, Review of scientific instruments, 67(3), 1996, pp. 681-687
THE PRACTICE OF THEORY - POSTSTRUCTURALISM, CULTURAL POLITICS, AND ART-HISTORY - MOXEY,K
Authors: STUMPEL J
Citation: J. Stumpel, THE PRACTICE OF THEORY - POSTSTRUCTURALISM, CULTURAL POLITICS, AND ART-HISTORY - MOXEY,K, Simiolus, 23(4), 1995, pp. 280-284
THE SI-28 LATTICE-PARAMETER
Authors: BECKER P KUETGENS U STUMPEL J BIERNACKI S SCHEFFLER M
Citation: P. Becker et al., THE SI-28 LATTICE-PARAMETER, PTB-Mitteilungen, 105(2), 1995, pp. 95-98
THE SI-28 PATH TO THE AVOGADRO CONSTANT - FIRST EXPERIMENTS AND OUTLOOK
Authors: BECKER P BETTIN H DEBIEVRE P HOLM C KUTGENS U SPIEWECK F STUMPEL J VALKIERS S ZULEHNER W
Citation: P. Becker et al., THE SI-28 PATH TO THE AVOGADRO CONSTANT - FIRST EXPERIMENTS AND OUTLOOK, IEEE transactions on instrumentation and measurement, 44(2), 1995, pp. 522-525
A MORE ACCURATE VALUE FOR THE AVOGADRO CONSTANT
Authors: DEBIEVRE P VALKIERS S PEISER S BECKER P LUDICKE F SPIEWECK F STUMPEL J
Citation: P. Debievre et al., A MORE ACCURATE VALUE FOR THE AVOGADRO CONSTANT, IEEE transactions on instrumentation and measurement, 44(2), 1995, pp. 530-532
A NEW DETERMINATION OF N-A
Authors: BASILE G BECKER P BERGAMIN A BETTIN H CAVAGNERO G DEBIEVRE P KUTGENS U MANA G MOSCA M PAJOT B PANCIERA R PASIN W PETTORRUSO S PEUTO A SACCONI A STUMPEL J VALKIERS S VITTONE E ZOSI G
Citation: G. Basile et al., A NEW DETERMINATION OF N-A, IEEE transactions on instrumentation and measurement, 44(2), 1995, pp. 538-541
SILICON CRYSTAL-LATTICE AS AN ATOMIC LENG TH SCALE
Authors: STUMPEL J BECKER P
Citation: J. Stumpel et P. Becker, SILICON CRYSTAL-LATTICE AS AN ATOMIC LENG TH SCALE, TM. Technisches Messen, 61(10), 1994, pp. 371-375
X-RAY INTERFERENCES IN SILICON-CRYSTALS - METHOD FOR PRECISION-MEASUREMENT OF ANGLES
Authors: BECKER P STUMPEL J WINDISCH D
Citation: P. Becker et al., X-RAY INTERFERENCES IN SILICON-CRYSTALS - METHOD FOR PRECISION-MEASUREMENT OF ANGLES, PTB-Mitteilungen, 104(6), 1994, pp. 445-453
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