SILICON CRYSTAL-LATTICE AS AN ATOMIC LENG TH SCALE

In many areas of science and technology, components manufactured with even higher precision are needed. Dimensional accuracies and surface q ualities are required whose tolerances are close to atomic dimensions. Measures for the determination of such small lengths are made availab le by nature of highest perfection. With x-ray interferometry atomic i nterspaces of the order of magnitude of a few fractions of one thousan d millionth of a meter with an accuracy, which for practical purposes can be selected at random, and transferred to other linear measuring s ystems.