Authors: CHAUDHURI J THOKALA R EDGAR JH SYWE BS

Citation: J. Chaudhuri et al., X-RAY DOUBLE-CRYSTAL CHARACTERIZATION OF SINGLE-CRYSTAL EPITAXIAL ALUMINUM NITRIDE THIN-FILMS ON SAPPHIRE, SILICON-CARBIDE AND SILICON SUBSTRATES, Journal of applied physics, 77(12), 1995, pp. 6263-6266

Authors: SYWE BS YU ZJ BURCKHARD S EDGAR JH CHAUDHURI J

Citation: Bs. Sywe et al., EPITAXIAL-GROWTH OF SIC ON SAPPHIRE SUBSTRATES WITH AN ALN BUFFER LAYER, Journal of the Electrochemical Society, 141(2), 1994, pp. 510-513