Authors: Salome, P Richier, C

Citation: P. Salome et C. Richier, ElectroStatic discharges (ESD), latch-up and pad design constraints, MICROEL ENG, 49(1-2), 1999, pp. 83-94

Authors: Salome, P Richier, C Essaifi, S Leroux, C Zaza, I Juge, A Mortini, P

Citation: P. Salome et al., Extended SPICE-like model accounting for layout effects on snapback phenomenon during ESD events., MICROEL REL, 39(6-7), 1999, pp. 833-838

Authors: Salome, P Leroux, C Crevel, P Chante, JP

Citation: P. Salome et al., Investigations on the thermal behavior of interconnects under ESD transients using a simplified thermal RC network, MICROEL REL, 39(11), 1999, pp. 1579-1591

Authors: Salome, P Leroux, C Mariolle, D Lafond, D Chante, JP Crevel, P Reimbold, G

Citation: P. Salome et al., An attempt to explain thermally induced soft failures during low level ESDstresses: study of the differences between soft and hard NMOS failures, MICROEL REL, 38(11), 1998, pp. 1763-1772