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Results: 1
High-quality Ge epilayers on Si with low threading-dislocation densities
Authors:
Luan, HC Lim, DR Lee, KK Chen, KM Sandland, JG Wada, K Kimerling, LC
Citation:
Hc. Luan et al., High-quality Ge epilayers on Si with low threading-dislocation densities, APPL PHYS L, 75(19), 1999, pp. 2909-2911
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