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Results: 1-12 |
Results: 12
Reduction of surface roughening due to copper contamination prior to ultra-thin gate oxidation
Authors: Peterson, CA Vermeire, B Sarid, D Parks, HG
Citation: Ca. Peterson et al., Reduction of surface roughening due to copper contamination prior to ultra-thin gate oxidation, APPL SURF S, 181(1-2), 2001, pp. 28-34
Comparative study of Sr and Ba adsorption on Si(100)
Authors: Hu, XM Yu, Z Curless, JA Droopad, R Eisenbeiser, K Edwards, JL Ooms, WJ Sarid, D
Citation: Xm. Hu et al., Comparative study of Sr and Ba adsorption on Si(100), APPL SURF S, 181(1-2), 2001, pp. 103-110
Comment on "Reversible, nanometer-scale conductance transitions in an organic complex" - art. no. 179706
Authors: Zhao, YM Fein, A Peterson, CA Sarid, D
Citation: Ym. Zhao et al., Comment on "Reversible, nanometer-scale conductance transitions in an organic complex" - art. no. 179706, PHYS REV L, 8717(17), 2001, pp. 9706-9706
Individually injected current pulses with conducting-tip, tapping-mode atomic force microscopy
Authors: Fein, A Zhao, YM Peterson, CA Jabbour, GE Sarid, D
Citation: A. Fein et al., Individually injected current pulses with conducting-tip, tapping-mode atomic force microscopy, APPL PHYS L, 79(24), 2001, pp. 3935-3937
Barium adsorption on Si(100)-(2 x 1) at room temperature: a bi-polar scanning tunneling microscopy study
Authors: Hu, X Yao, X Peterson, CA Sarid, D Yu, Z Wang, J Marshall, DS Curless, JA Ramdani, J Droopad, R Hallmark, JA Ooms, WJ
Citation: X. Hu et al., Barium adsorption on Si(100)-(2 x 1) at room temperature: a bi-polar scanning tunneling microscopy study, SURF SCI, 457(1-2), 2000, pp. L391-L396
The (3 x 2) phase of Ba adsorption on Si(001)-2 x 1
Authors: Hu, X Yao, X Peterson, CA Sarid, D Yu, Z Wang, J Marshall, DS Droopad, R Hallmark, JA Ooms, WJ
Citation: X. Hu et al., The (3 x 2) phase of Ba adsorption on Si(001)-2 x 1, SURF SCI, 445(2-3), 2000, pp. 256-266
Nano-patterning and single electron tunnelling using STM
Authors: Hu, XM Sarid, D von Blanckenhagen, P
Citation: Xm. Hu et al., Nano-patterning and single electron tunnelling using STM, NANOTECHNOL, 10(2), 1999, pp. 209-212
Effects of moisture on Fowler-Nordheim characterization of thin silicon-oxide films
Authors: Peterson, CA Workman, RK Sarid, D Vermeire, B Parks, HG Adderton, D Maivald, P
Citation: Ca. Peterson et al., Effects of moisture on Fowler-Nordheim characterization of thin silicon-oxide films, J VAC SCI A, 17(5), 1999, pp. 2753-2758
Initial stages of Ba adsorption on the Si(100)-(2x1) surface at room temperature
Authors: Yao, X Hu, XM Sarid, D Yu, Z Wang, J Marshall, DS Droopad, R Abrokwah, JK Hallmark, JA Ooms, WJ
Citation: X. Yao et al., Initial stages of Ba adsorption on the Si(100)-(2x1) surface at room temperature, PHYS REV B, 59(7), 1999, pp. 5115-5119
Phases of Ba adsorption on Si(100)-(2 x 1) studied by LEED and AES
Authors: Hu, XM Peterson, CA Sarid, D Yu, Z Wang, J Marshall, DS Droopad, R Hallmark, JA Ooms, WJ
Citation: Xm. Hu et al., Phases of Ba adsorption on Si(100)-(2 x 1) studied by LEED and AES, SURF SCI, 426(1), 1999, pp. 69-74
Current-dependent growth of silicon nitride lines using a conducting tip AFM
Authors: Workman, RK Peterson, CA Sarid, D
Citation: Rk. Workman et al., Current-dependent growth of silicon nitride lines using a conducting tip AFM, SURF SCI, 423(2-3), 1999, pp. L277-L279
V-shaped metallic-wire cantilevers for combined atomic force microscopy and Fowler-Nordheim imaging
Authors: Peterson, CA Workman, RK Yao, XW Hunt, JP Sarid, D
Citation: Ca. Peterson et al., V-shaped metallic-wire cantilevers for combined atomic force microscopy and Fowler-Nordheim imaging, NANOTECHNOL, 9(4), 1998, pp. 331-336
Risultati: 1-12 |