Authors:
Rizzo, A
Tagliente, MA
Alvisi, M
Scaglione, S
Citation: A. Rizzo et al., Structural and optical properties of silver thin films deposited by RF magnetron sputtering, THIN SOL FI, 396(1-2), 2001, pp. 29-35
Authors:
Alvisi, M
De Tomasi, F
Perrone, MR
Protopapa, ML
Rizzo, A
Sarto, F
Scaglione, S
Citation: M. Alvisi et al., Laser damage dependence on structural and optical properties of ion-assisted HfO2 thin films, THIN SOL FI, 396(1-2), 2001, pp. 44-52
Authors:
Tosti, S
Violante, V
Basile, A
Chiappetta, G
Castelli, S
De Francesco, M
Scaglione, S
Sarto, F
Citation: S. Tosti et al., Catalytic membrane reactors for tritium recovery from tritiated water in the ITER fuel cycle, FUSION ENG, 49, 2000, pp. 953-958
Authors:
Alvisi, M
Mirenghi, L
Tapfer, L
Rizzo, A
Ferrara, MC
Scaglione, S
Vasanelli, L
Citation: M. Alvisi et al., Structural and chemical investigation of surface and interface of multilayer optical coatings deposited by DIBS, APPL SURF S, 157(1-2), 2000, pp. 52-60
Authors:
Kohler, L
Scaglione, S
Giorgi, R
Riga, J
Rudolf, P
Caudano, R
Citation: L. Kohler et al., Ability of a Kaufman source to functionalize the surface of polystyrene bylow-energy (80-225 eV) nitrogen ion bombardment, SURF INT AN, 29(10), 2000, pp. 647-652
Authors:
Rizzo, A
Tagliente, MA
Caneve, L
Scaglione, S
Citation: A. Rizzo et al., The influence of the momentum transfer on the structural and optical properties of ZnSe thin films prepared by r.f. magnetron sputtering, THIN SOL FI, 368(1), 2000, pp. 8-14
Citation: S. Scaglione et G. Vulpetti, The Aurora project: Removal of plastic substrate to obtain an all-metal solar sail, ACT ASTRONA, 44(2-4), 1999, pp. 147-150
Authors:
Alvisi, M
Scaglione, S
Martelli, S
Rizzo, A
Vasanelli, L
Citation: M. Alvisi et al., Structural and optical modification in hafnium oxide thin films related tothe momentum parameter transferred by ion beam assistance, THIN SOL FI, 354(1-2), 1999, pp. 19-23
Authors:
Alvisi, M
De Nunzio, G
Perrone, MR
Rizzo, A
Scaglione, S
Vasanelli, L
Citation: M. Alvisi et al., Influence of the assisting-ion-beam parameters on the laser-damage threshold of SiO2 films, THIN SOL FI, 338(1-2), 1999, pp. 269-275