Authors: Scalese, S Franzo, G Mirabella, S Re, M Terrasi, A Priolo, F Rimini, E Camera, A

Citation: S. Scalese et al., Si : Er : O layers grown by molecular beam epitaxy: structural, electricaland optical properties, MAT SCI E B, 81(1-3), 2001, pp. 62-66

Authors: Re, M Scalese, S Mirabella, S Terrasi, A Priolo, F Rimini, E Berti, M Coati, A Drigo, A Carnera, A De Salvador, D Spinella, C La Mantia, A

Citation: M. Re et al., Structural characterisation and stability of Si1-xGex/Si(100) heterostructures grown by molecular beam epitaxy, J CRYST GR, 227, 2001, pp. 749-755

Authors: Caputi, LS Marsico, R Scalese, S Cupolillo, A Chiarello, G Colavita, E Papagno, L

Citation: Ls. Caputi et al., Structural study of Ni (100)-c(2 x 2)-Sn, by electron-energy-loss holography, SURF SCI, 444(1-3), 2000, pp. 61-65

Authors: Scalese, S Franzo, G Mirabella, S Re, M Terrasi, A Priolo, F Rimini, E Spinella, C Carnera, A

Citation: S. Scalese et al., Effect of O : Er concentration ratio on the structural, electrical, and optical properties of Si : Er : O layers grown by molecular beam epitaxy, J APPL PHYS, 88(7), 2000, pp. 4091-4096

Authors: Osten, HJ Griesche, J Scalese, S

Citation: Hj. Osten et al., Substitutional carbon incorporation in epitaxial Si1-yCy alloys on Si(001)grown by molecular beam epitaxy, APPL PHYS L, 74(6), 1999, pp. 836-838