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Results:
1-14
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Results: 14
Authors:
Luitz, J
Maier, M
Hebert, C
Schattschneider, P
Blaha, P
Schwarz, K
Jouffrey, B
Citation: J. Luitz et al., Partial core hole screening in the Cu L-3 edge, EUR PHY J B, 21(3), 2001, pp. 363-367
Authors:
Reitinger, M
Offerlbauer, D
Louf, PH
Schattschneider, P
Su, DS
Zeitler, E
Citation: M. Reitinger et al., Energy loss near edge structure of sulfur in non-stoichiometric CuInS2, MICRON, 32(2), 2001, pp. 141-146
Authors:
Hebert, C
Clair, S
Eisenmenger-Sittner, C
Bangert, H
Jouffrey, B
Schattschneider, P
Citation: C. Hebert et al., Electron energy-loss spectroscopy fine structure of the Cu L-2,L-3 ionization edge in substitutional Cu-Ni alloys, J PHYS-COND, 13(16), 2001, pp. 3791-3803
Authors:
Stoger, M
Schattschneider, P
Schlosser, V
Schneider, R
Kirmse, H
Neumann, W
Citation: M. Stoger et al., TEM and EELS microanalysis of pc-Si thin film solar cells deposited by means of HWCVD, SOL EN MAT, 70(1), 2001, pp. 39-47
Authors:
Schattschneider, P
Hebert, C
Jouffrey, B
Citation: P. Schattschneider et al., Orientation dependence of ionization edges in EELS, ULTRAMICROS, 86(3-4), 2001, pp. 343-353
Authors:
Hebert-Souche, C
Bernardi, J
Schattschneider, P
Fidler, J
Jouffrey, B
Citation: C. Hebert-souche et al., Phase analysis of nanocomposite magnetic materials by electron energy lossspectrometry, EPJ-APPL PH, 9(2), 2000, pp. 147-151
Authors:
Schattschneider, P
Nelhiebel, M
Souchay, H
Jouffrey, B
Citation: P. Schattschneider et al., The physical significance of the mixed dynamic form factor, MICRON, 31(4), 2000, pp. 333-345
Authors:
Stoger, M
Nelhiebel, M
Schattschneider, P
Schlosser, V
Breymesser, A
Jouffrey, B
Citation: M. Stoger et al., EELS microanalysis of polycrystalline silicon thin films for solar cells grown at low temperatures, SOL EN MAT, 63(2), 2000, pp. 177-184
Authors:
Hebert-Souche, C
Louf, PH
Blaha, P
Nelheibel, M
Luitz, J
Schattschneider, P
Schwarz, K
Jouffrey, B
Citation: C. Hebert-souche et al., The orientation-dependent simulation of ELNES, ULTRAMICROS, 83(1-2), 2000, pp. 9-16
Authors:
Nelhiebel, M
Schattschneider, P
Jouffrey, B
Citation: M. Nelhiebel et al., Observation of ionization in a crystal interferometer, PHYS REV L, 85(9), 2000, pp. 1847-1850
Authors:
Nelhiebel, M
Luchier, N
Schorsch, P
Schattschneider, P
Jouffrey, B
Citation: M. Nelhiebel et al., The mixed dynamic form factor for atomic core-level excitations in interferometric electron-energy-loss experiments, PHIL MAG B, 79(6), 1999, pp. 941-953
Authors:
Stoger, M
Breymesser, A
Schlosser, V
Ramadori, M
Plunger, V
Peiro, D
Voz, C
Bertomeu, J
Nelhiebel, M
Schattschneider, P
Andreu, J
Citation: M. Stoger et al., Investigation of defect formation and electronic transport in microcrystalline silicon deposited by hot-wire CVD, PHYSICA B, 274, 1999, pp. 540-543
Authors:
Nelhiebel, M
Louf, PH
Schattschneider, P
Blaha, P
Schwarz, K
Jouffrey, B
Citation: M. Nelhiebel et al., Theory of orientation-sensitive near-edge fine-structure core-level spectroscopy, PHYS REV B, 59(20), 1999, pp. 12807-12814
Authors:
Schattschneider, P
Nelhiebel, M
Jouffrey, B
Citation: P. Schattschneider et al., Density matrix of inelastically scattered fast electrons, PHYS REV B, 59(16), 1999, pp. 10959-10969
Risultati:
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