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Authors:
Healy, SB
Filippi, C
Kratzer, P
Penev, E
Scheffler, M
Citation: Sb. Healy et al., Role of electronic correlation in the Si(100) reconstruction: A quantum Monte Carlo study - art. no. 016105, PHYS REV L, 8701(1), 2001, pp. 6105-NIL_101
Citation: M. Scheffler et al., A simplified yield modeling method for design rule trade-off in interconnection substrates, MICROEL REL, 41(6), 2001, pp. 861-869
Authors:
Ebert, P
Quadbeck, P
Urban, K
Henninger, B
Horn, K
Schwarz, G
Neugebauer, J
Scheffler, M
Citation: P. Ebert et al., Identification of surface anion antisite defects in (110) surfaces of III-V semiconductors, APPL PHYS L, 79(18), 2001, pp. 2877-2879
Citation: A. Schwartz et al., Determination of the magnetization scaling exponent for single-crystal La0.8Sr0.2MnO3 by broadband microwave surface impedance measurements, PHYS REV B, 61(2), 2000, pp. R870-R873
Authors:
Hertel, G
Kerr, NL
Scheffler, M
Geister, S
Messe, LA
Citation: G. Hertel et al., Exploring the Kohler motivation gain effect: Impression management and spontaneous goal setting, Z SOZIALPSY, 31(4), 2000, pp. 204-220
Citation: Sh. Lee et al., GaAs(001) surface under conditions of low As pressure: Evidence for a novel surface geometry, PHYS REV L, 85(18), 2000, pp. 3890-3893