Authors:
Biegel, W
Klarmann, R
Stritzker, B
Schey, B
Kuhn, M
Citation: W. Biegel et al., Pulsed laser deposition and characterization of perovskite thin films on various substrates, APPL SURF S, 168(1-4), 2000, pp. 227-233
Authors:
Kuhn, M
Schey, B
Biegel, W
Stritzker, B
Eisenmenger, J
Leiderer, P
Heismann, B
Kramer, HP
Neumuller, HW
Citation: M. Kuhn et al., Defect visualization in large area YBCO thin films by magneto-optical scanning technique, IEEE APPL S, 9(2), 1999, pp. 1844-1847
Authors:
Pimenov, A
Loidl, A
Schey, B
Stritzker, B
Jakob, G
Adrian, H
Pronin, AV
Goncharov, YG
Citation: A. Pimenov et al., Universal relationship between the penetration depth and the normal-state conductivity in YBaCuO, EUROPH LETT, 48(1), 1999, pp. 73-78