Authors: Schleef, D

Citation: D. Schleef, "That's a good question!" Exploring motivations for law and business school choice, SOCIOL EDUC, 73(3), 2000, pp. 155-174

Authors: Enachescu, M Schleef, D Ogletree, DF Salmeron, M

Citation: M. Enachescu et al., Integration of point-contact microscopy and atomic-force microscopy: Application to characterization of graphite/Pt(111), PHYS REV B, 60(24), 1999, pp. 16913-16919

Authors: Schleef, D Parry, M Tu, SJ Woodahl, B Fischbach, E

Citation: D. Schleef et al., Application of geometric probability techniques to the evaluation of interaction energies arising from a general radial potential, J MATH PHYS, 40(2), 1999, pp. 1103-1112