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Citation: H. Schneidewind et al., 2212-Tl-Ba-Ca-Cu-O films on 3 '' sapphire wafers for high frequency filters, IEEE APPL S, 11(1), 2001, pp. 3106-3109

Authors: Schneidewind, H Manzel, M Bruchlos, G Kirsch, K

Citation: H. Schneidewind et al., TlBaCaCuO-(2212) thin films on lanthanum aluminate and sapphire substratesfor microwave filters, SUPERCOND S, 14(4), 2001, pp. 200-212

Authors: Seidel, P Schmidl, F Wunderlich, S Dorrer, L Vogt, T Schneidewind, H Weidl, R Losche, S Leder, U Solbig, O Nowak, H

Citation: P. Seidel et al., High-Tc SQUID systems for practical use, IEEE APPL S, 9(2), 1999, pp. 4077-4080

Authors: Wunderlich, S Schmidl, F Dorrer, L Schneidewind, H Seidel, P

Citation: S. Wunderlich et al., Improvement of sensor performance of high-T-C thin film planar SQUID gradiometers by ion beam etching, IEEE APPL S, 9(1), 1999, pp. 71-76

Authors: Tian, YJ Linzen, S Schmidl, F Matthes, A Schneidewind, H Seidel, P

Citation: Yj. Tian et al., On ageing and critical thickness of YBa2Cu3O7 films on Si with CeO2/YSZ buffer layers, THIN SOL FI, 338(1-2), 1999, pp. 224-230

Authors: Dorrer, L Wunderlich, S Schmidl, F Schneidewind, H Hubner, U Seidel, P

Citation: L. Dorrer et al., Development of planar thin film HTSC-SQUID gradiometers for different applications, APPL SUPERC, 6(7-9), 1998, pp. 349-354