Authors: Franquet, A De Laet, J Schram, T Terryn, H Subramanian, V van Ooij, WJ Vereecken, J

Citation: A. Franquet et al., Determination of the thickness of thin silane films on aluminium surfaces by means of spectroscopic ellipsometry, THIN SOL FI, 384(1), 2001, pp. 37-45

Authors: Schram, T Terryn, H

Citation: T. Schram et H. Terryn, The use of infrared spectroscopic ellipsometry for the thickness determination and molecular characterization of thin films on aluminum, J ELCHEM SO, 148(2), 2001, pp. F12-F20

Authors: Schram, T Terryn, H Franquet, A

Citation: T. Schram et al., Feasibility study to probe thin inorganic and organic coatings on aluminium substrates by means of visible and infrared spectroscopic ellipsometry, SURF INT AN, 30(1), 2000, pp. 507-513

Authors: Schram, T Franquet, A Terryn, H Vereecken, J

Citation: T. Schram et al., Spectroscopic ellipsometry: a non-destructive technique for surface analysis, ADV ENG MAT, 1(1), 1999, pp. 63-66

Authors: Schram, T

Citation: T. Schram, Cultural therapy and the explicitness of our intentions, ANTHR EDUC, 30(4), 1999, pp. 473-476