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Results: 3
1999 IEEE Nuclear and Space Radiation Effects Conference
Authors: Schrimpf, R
Citation: R. Schrimpf, 1999 IEEE Nuclear and Space Radiation Effects Conference, IEEE NUCL S, 46(6), 1999, pp. 1323-1325
Analysis of the influence of MOS device geometry on predicted SEU cross sections
Authors: Warren, K Massengill, L Schrimpf, R Barnaby, H
Citation: K. Warren et al., Analysis of the influence of MOS device geometry on predicted SEU cross sections, IEEE NUCL S, 46(6), 1999, pp. 1363-1369
Hardness assurance implications of bimodal total dose response in a bipolar linear voltage comparator
Authors: Krieg, J Turflinger, T Titus, J Cole, P Baker, P Gehlhausen, M Emily, D Yang, L Pease, RL Barnaby, H Schrimpf, R Maher, MC
Citation: J. Krieg et al., Hardness assurance implications of bimodal total dose response in a bipolar linear voltage comparator, IEEE NUCL S, 46(6), 1999, pp. 1627-1632
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