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Results:
1-8
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Results: 8
Authors:
Zeitler, U
Schumacher, HW
Haug, RJ
Jansen, AGM
Citation: U. Zeitler et al., Transport anisotropies in a Si/SiGe heterostructure induced by an in-planemagnetic field, PHYSICA B, 298(1-4), 2001, pp. 501-504
Authors:
Keyser, UF
Schumacher, HW
Zeitler, U
Haug, RJ
Eberl, K
Citation: Uf. Keyser et al., Fabrication of quantum dots with scanning probe nanolithography, PHYS ST S-B, 224(3), 2001, pp. 681-684
Authors:
Zeitler, U
Schumacher, HW
Jansen, AGM
Haug, RJ
Citation: U. Zeitler et al., Magnetoresistance anisotropy in Si/SiGe in tilted magnetic fields: Experimental evidence for a stripe-phase formation, PHYS REV L, 86(5), 2001, pp. 866-869
Authors:
Schumacher, HW
Ravelosona, D
Cayssol, F
Wunderlich, J
Chappert, C
Mathet, V
Thiaville, A
Jamet, JP
Ferre, J
Haug, RJ
Citation: Hw. Schumacher et al., Propagation of a magnetic domain wall in the presence of AFM fabricated defects, IEEE MAGNET, 37(4), 2001, pp. 2331-2333
Authors:
Keyser, UF
Schumacher, HW
Zeitler, U
Haug, RJ
Eberl, K
Citation: Uf. Keyser et al., Fabrication of a single-electron transistor by current-controlled local oxidation of a two-dimensional electron system, APPL PHYS L, 76(4), 2000, pp. 457-459
Authors:
Hapke-Wurst, I
Zeitler, U
Schumacher, HW
Haug, RJ
Pierz, K
Ahlers, FJ
Citation: I. Hapke-wurst et al., Size determination of InAs quantum dots using magneto-tunnelling experiments, SEMIC SCI T, 14(11), 1999, pp. L41-L43
Authors:
Schumacher, HW
Keyser, UF
Zeitler, U
Haug, RJ
Eberl, K
Citation: Hw. Schumacher et al., Nanomachining of mesoscopic electronic devices using an atomic force microscope, APPL PHYS L, 75(8), 1999, pp. 1107-1109
Authors:
Schumacher, HW
Nauen, A
Zeitler, U
Haug, RJ
Weitz, P
Jansen, AGM
Schaffler, F
Citation: Hw. Schumacher et al., Anomalous coincidences between valley split Landau levels in a Si/SiGe heterostructure, PHYSICA B, 258, 1998, pp. 260-263
Risultati:
1-8
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