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Results: 1-10 |
Results: 10
Proximity effects in Fe1-xCox/Mn/Fe1-xCox trilayers
Authors: Nerger, S Kentzinger, E Rucker, U Voigt, J Ott, F Seeck, OH Bruckel, T
Citation: S. Nerger et al., Proximity effects in Fe1-xCox/Mn/Fe1-xCox trilayers, PHYSICA B, 297(1-4), 2001, pp. 185-188
Correlated surfaces of free-standing polystyrene thin films
Authors: Shin, K Pu, Y Rafailovich, MH Sokolov, J Seeck, OH Sinha, SK Tolan, M Kolb, R
Citation: K. Shin et al., Correlated surfaces of free-standing polystyrene thin films, MACROMOLEC, 34(16), 2001, pp. 5620-5626
Neutron and x-ray evidence of charge melting in ferromagnetic layered colossal magnetoresistance manganites (invited)
Authors: Vasiliu-Doloc, L Osborn, R Rosenkranz, S Mesot, J Mitchell, JF Sinha, SK Seeck, OH Lynn, JW Islam, Z
Citation: L. Vasiliu-doloc et al., Neutron and x-ray evidence of charge melting in ferromagnetic layered colossal magnetoresistance manganites (invited), J APPL PHYS, 89(11), 2001, pp. 6840-6845
X-ray scattering from polymer films
Authors: Tolan, M Seeck, OH Wang, J Sinha, SK Refailovich, MH Sokolov, J
Citation: M. Tolan et al., X-ray scattering from polymer films, PHYSICA B, 283(1-3), 2000, pp. 22-26
Polaron ordering in ferromagnetic colossal magnetoresistive oxides
Authors: Vasiliu-Doloc, L Osborn, R Rosenkranz, S Mesot, J Mitchell, JF Sinha, SK Seeck, OH Lynn, JW Islam, Z
Citation: L. Vasiliu-doloc et al., Polaron ordering in ferromagnetic colossal magnetoresistive oxides, INT J MOD B, 14(29-31), 2000, pp. 3711-3718
Structural characterization of oxidized allotaxially grown CoSi2 layers byx-ray scattering
Authors: Kaendler, ID Seeck, OH Schlomka, JP Tolan, M Press, W Stettner, J Kappius, L Dieker, C Mantl, S
Citation: Id. Kaendler et al., Structural characterization of oxidized allotaxially grown CoSi2 layers byx-ray scattering, J APPL PHYS, 87(1), 2000, pp. 133-139
Analysis of x-ray reflectivity data from low-contrast polymer bilayer systems using a Fourier method
Authors: Seeck, OH Kaendler, ID Tolan, M Shin, K Rafailovich, MH Sokolov, J Kolb, R
Citation: Oh. Seeck et al., Analysis of x-ray reflectivity data from low-contrast polymer bilayer systems using a Fourier method, APPL PHYS L, 76(19), 2000, pp. 2713-2715
Surface phase transition close to a bulk tricritical point: An x-ray studyof ND4Cl
Authors: Seeck, OH Hupfeld, D Krull, H Doerr, AK Schlomka, JP Tolan, M Press, W
Citation: Oh. Seeck et al., Surface phase transition close to a bulk tricritical point: An x-ray studyof ND4Cl, PHYS REV B, 59(5), 1999, pp. 3474-3479
Surfaces of strongly confined polymer thin films studied by X-ray scattering
Authors: Wang, J Tolan, M Seeck, OH Sinha, SK Bahr, O Rafailovich, MH Sokolov, J
Citation: J. Wang et al., Surfaces of strongly confined polymer thin films studied by X-ray scattering, PHYS REV L, 83(3), 1999, pp. 564-567
Charge melting and polaron collapse in La1.2Sr1.8Mn2O7
Authors: Vasiliu-Doloc, L Rosenkranz, S Osborn, R Sinha, SK Lynn, JW Mesot, J Seeck, OH Preosti, G Fedro, AJ Mitchell, JF
Citation: L. Vasiliu-doloc et al., Charge melting and polaron collapse in La1.2Sr1.8Mn2O7, PHYS REV L, 83(21), 1999, pp. 4393-4396
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