Authors: Zou, Z Hu, YF Sham, TK Huang, HH Xu, GQ Seet, CS Chan, L

Citation: Z. Zou et al., XAFS studies of Al/TiNx films on Si(100) at the Al K- and L-3,L-2-edge, J SYNCHROTR, 6, 1999, pp. 524-525