ACNP - Italian Periodicals Catalogue

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Results: 1-9 |

Results: 9

Photoreflectance investigations of GaN epitaxial layers

Authors: Sitarek, P Kudrawiec, R Sek, G Misiewicz, J Paszkiewicz, R Korbutowicz, R Paszkiewicz, B Tlaczala, M

Citation: P. Sitarek et al., Photoreflectance investigations of GaN epitaxial layers, MAT SCI E B, 82(1-3), 2001, pp. 209-211

Influence of built-in electric field on forbidden transitions in InxGa1-xAs/GaAs double quantum well by three-beam photoreflectance

Authors: Sek, G Ryczko, K Misiewicz, J Bayer, M Wang, T Forchel, A

Citation: G. Sek et al., Influence of built-in electric field on forbidden transitions in InxGa1-xAs/GaAs double quantum well by three-beam photoreflectance, ACT PHY P A, 100(3), 2001, pp. 417-424

Photoreflectance spectroscopy of InGaAsN/GaAs quantum wells grown by MBE (vol 380, pg 240, 2000)

Authors: Sek, G Ryczko, K Misiewicz, J Fischer, M Reinhardt, M Forchel, A

Citation: G. Sek et al., Photoreflectance spectroscopy of InGaAsN/GaAs quantum wells grown by MBE (vol 380, pg 240, 2000), THIN SOL FI, 392(1), 2001, pp. 150-150

Photoreflectance spectroscopy of vertically coupled InGaAs/GaAs double quantum dots

Authors: Sek, G Ryczko, K Misiewicz, J Bayer, M Klopf, F Reithmaier, JP Forchel, A

Citation: G. Sek et al., Photoreflectance spectroscopy of vertically coupled InGaAs/GaAs double quantum dots, SOL ST COMM, 117(7), 2001, pp. 401-406

Optical characterisation of strained-layer InxGa1-xAs/GaAs MQW LED grown by MOVPE

Authors: Sek, G Ciorga, M Bryja, L Misiewicz, J Radziewicz, D Sciana, B Tlaczala, M

Citation: G. Sek et al., Optical characterisation of strained-layer InxGa1-xAs/GaAs MQW LED grown by MOVPE, OPT APPL, 30(1), 2000, pp. 183-188

Photoreflectance spectroscopy of InGaAsN/GaAs quantum wells grown by MB

Authors: Sek, G Ryczko, K Misiewicz, J Fischer, M Reinhardt, M Forchel, A

Citation: G. Sek et al., Photoreflectance spectroscopy of InGaAsN/GaAs quantum wells grown by MB, THIN SOL FI, 380(1-2), 2000, pp. 240-242

Photoreflectance study of delta-doped semiconductor layers by a fast Fourier transformation

Authors: Nowaczyk, M Sek, G Misiewicz, J Sciana, B Radziewivz, D Tlaczala, M

Citation: M. Nowaczyk et al., Photoreflectance study of delta-doped semiconductor layers by a fast Fourier transformation, THIN SOL FI, 380(1-2), 2000, pp. 243-245

Photoreflectance spectroscopy of coupled InxGa1-xAs/GaAs quantum wells

Authors: Sek, G Ryczko, K Kubisa, M Misiewicz, J Bayer, M Wang, T Koeth, J Forchel, A

Citation: G. Sek et al., Photoreflectance spectroscopy of coupled InxGa1-xAs/GaAs quantum wells, THIN SOL FI, 364(1-2), 2000, pp. 220-223

Room temperature photoreflectance of MOCVD-grown InAs GaAs quantum dots

Authors: Sek, G Misiewicz, J Ryczko, K Kubisa, M Heinrichsdorff, F Stier, O Bimberg, D

Citation: G. Sek et al., Room temperature photoreflectance of MOCVD-grown InAs GaAs quantum dots, SOL ST COMM, 110(12), 1999, pp. 657-660

Risultati: 1-9 |