Authors: Singhal, RK Dalela, S Chaturvedi, D Dalela, B Saini, NL Sekhar, BR Garg, KB Beaumount, V Mercey, B Chen, CT Lin, HJ Huo, TY

Citation: Rk. Singhal et al., An electronic structure study of c-axis oriented NdBCO (123) thin films using polarized soft x-ray absorption spectroscopy on Cu L-3 and OK edges, J PHYS-COND, 13(31), 2001, pp. 6865-6874

Authors: Prasad, GVR Patel, BK Chakravarty, S Mythili, R Vijaylakshmi, M Sekhar, BR Sahu, SN Ramamurthy, VS Behera, SN

Citation: Gvr. Prasad et al., Low energy cluster beam deposition technique: Development and deposition of cluster assembled Sb thin films, CURRENT SCI, 80(2), 2001, pp. 280-284

Authors: Rousset, JL Aires, FJCS Sekhar, BR Melinon, P Prevel, B Pellarin, M

Citation: Jl. Rousset et al., Comparative X-ray photoemission spectroscopy study of Au, Ni, and AuNi clusters produced by laser vaporization of bulk metals, J PHYS CH B, 104(23), 2000, pp. 5430-5435

Authors: Sekhar, BR Prabhu, KMM

Citation: Br. Sekhar et Kmm. Prabhu, Radix-2 decimation-in-frequency algorithm for the computation of the real-valued FFT, IEEE SIGNAL, 47(4), 1999, pp. 1181-1184

Authors: Asokan, K Sekhar, BR Rao, KVR Garg, KB

Citation: K. Asokan et al., Identification of Zn site using XPS in Zn doped YBa2Cu3O7, I J PA PHYS, 36(8), 1998, pp. 444-448