AAAAAA

   
Results: 1-25 | 26-36 |
Results: 26-36/36
Study of the electronic structure of Au-V bimetallics using X-ray photoelectron spectroscopy (XPS) and X-ray absorption near-edge structure (XANES)
Authors: Naftel, SJ Bzowski, A Sham, TK
Citation: Sj. Naftel et al., Study of the electronic structure of Au-V bimetallics using X-ray photoelectron spectroscopy (XPS) and X-ray absorption near-edge structure (XANES), J ALLOY COM, 283(1-2), 1999, pp. 5-11
Edge-jump inversion in the Si L-3,L-2-edge optical XAFS of porous silicon
Authors: Sham, TK Coulthard, I
Citation: Tk. Sham et I. Coulthard, Edge-jump inversion in the Si L-3,L-2-edge optical XAFS of porous silicon, J SYNCHROTR, 6, 1999, pp. 215-216
XAFS studies of Al/TiNx films on Si(100) at the Al K- and L-3,L-2-edge
Authors: Zou, Z Hu, YF Sham, TK Huang, HH Xu, GQ Seet, CS Chan, L
Citation: Z. Zou et al., XAFS studies of Al/TiNx films on Si(100) at the Al K- and L-3,L-2-edge, J SYNCHROTR, 6, 1999, pp. 524-525
Co L-3,2-edge and multi-detection channel XAFS studies of Co-Si interactions
Authors: Naftel, SJ Sham, TK
Citation: Sj. Naftel et Tk. Sham, Co L-3,2-edge and multi-detection channel XAFS studies of Co-Si interactions, J SYNCHROTR, 6, 1999, pp. 526-528
XAFS studies of Rh nanostructures on porous silicon
Authors: Zhu, YJ Coulthard, I Sham, TK
Citation: Yj. Zhu et al., XAFS studies of Rh nanostructures on porous silicon, J SYNCHROTR, 6, 1999, pp. 529-531
Electronic structure of Au-Ag bimetallics: Surface alloying on Ru(001)
Authors: Bzowski, A Kuhn, M Sham, TK Rodriguez, JA Hrbek, J
Citation: A. Bzowski et al., Electronic structure of Au-Ag bimetallics: Surface alloying on Ru(001), PHYS REV B, 59(20), 1999, pp. 13379-13393
Luminescence from porous silicon: an optical X-ray absorption fine structures study at the Si L-3,L-2-edge
Authors: Coulthard, I Sham, TK
Citation: I. Coulthard et Tk. Sham, Luminescence from porous silicon: an optical X-ray absorption fine structures study at the Si L-3,L-2-edge, SOL ST COMM, 110(4), 1999, pp. 203-208
Ion-beam-induced surface damages on tris-(8-hydroxyquinoline) aluminum
Authors: Liao, LS Hung, LS Chan, WC Ding, XM Sham, TK Bello, I Lee, CS Lee, ST
Citation: Ls. Liao et al., Ion-beam-induced surface damages on tris-(8-hydroxyquinoline) aluminum, APPL PHYS L, 75(11), 1999, pp. 1619-1621
Electronic structure of nickel silicide in subhalf-micron lines and blanket films: An x-ray absorption fine structures study at the Ni and Si L-3,L-2edge
Authors: Naftel, SJ Coulthard, I Sham, TK Xu, DX Erickson, L Das, SR
Citation: Sj. Naftel et al., Electronic structure of nickel silicide in subhalf-micron lines and blanket films: An x-ray absorption fine structures study at the Ni and Si L-3,L-2edge, APPL PHYS L, 74(19), 1999, pp. 2893-2895
Secondary ion mass spectroscopy and synchrotron X-ray fluorescence in the study of the qualitative variation in metal content with time in tree rings
Authors: Martin, RR Sham, TK Won, GW van der Heide, P Jones, KW Song, SR Protz, R
Citation: Rr. Martin et al., Secondary ion mass spectroscopy and synchrotron X-ray fluorescence in the study of the qualitative variation in metal content with time in tree rings, CAN J FORES, 28(10), 1998, pp. 1464-1470
Gold nanoclusters reductively deposited on porous silicon: morphology and electronic structures
Authors: Coulthard, I Degen, S Zhu, YJ Sham, TK
Citation: I. Coulthard et al., Gold nanoclusters reductively deposited on porous silicon: morphology and electronic structures, CAN J CHEM, 76(11), 1998, pp. 1707-1716
Risultati: 1-25 | 26-36 |