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Citation: Vt. Bublik et al., Effect of thermal annealing conditions on the microdefect formation in undoped GaAs single crystals grown by Czochralski method, CRYSTALLO R, 45(5), 2000, pp. 821-826

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Citation: Vi. Vdovin et al., A study of structural perfection of interfaces in Si/SiGe superlattices, CRYSTALLO R, 45(4), 2000, pp. 661-669

Authors: Bublik, VT Shcherbachev, KD Komarnitskaya, EA Parkhomenko, YN Vygovskaya, EA Evgen'ev, SB

Citation: Vt. Bublik et al., Formation of radiation-induced point defects in silicon doped thin films upon ion implantation and activating annealing, CRYSTALLO R, 44(6), 1999, pp. 1035-1041