AAAAAA

   
Results: 1-2 |
Results: 2
Electrothermal vaporization-inductively coupled plasma-atomic emission spectrometry for the direct determination of trace amounts of impurities in slurries of silicon carbide
Authors: Peng, TY Chang, G Sheng, XH Jiang, ZC Hu, B
Citation: Ty. Peng et al., Electrothermal vaporization-inductively coupled plasma-atomic emission spectrometry for the direct determination of trace amounts of impurities in slurries of silicon carbide, ANALYT CHIM, 433(2), 2001, pp. 255-262
Direct analysis of silicon carbide by fluorination assisted electrothermalvaporization inductively coupled plasma atomic emission spectrometry usinga slurry sampling technique
Authors: Peng, TY Sheng, XH Hu, B Jiang, ZC
Citation: Ty. Peng et al., Direct analysis of silicon carbide by fluorination assisted electrothermalvaporization inductively coupled plasma atomic emission spectrometry usinga slurry sampling technique, ANALYST, 125(11), 2000, pp. 2089-2093
Risultati: 1-2 |