Authors:
Teramoto, A
Kobayashi, K
Ohno, Y
Shigetomi, A
Citation: A. Teramoto et al., Excess currents induced by hot hole injection and FN electron injection inthin SiO2 films, IEEE DEVICE, 48(5), 2001, pp. 868-873
Authors:
Teramoto, A
Umeda, H
Tamura, H
Nishida, Y
Sayama, H
Terada, K
Kawase, K
Ohno, Y
Shigetomi, A
Citation: A. Teramoto et al., Precise control of nitrogen profiles and nitrogen bond states for highly reliable N2O-grown oxynitride, J ELCHEM SO, 147(5), 2000, pp. 1888-1892