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Results:
1-7
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Results: 7
Authors:
Sun, YS
Tu, YC
Shih, WK
Citation: Ys. Sun et al., Frame-based worst-case weighted fair queueing with jitter control, IEICE TR CO, E84B(8), 2001, pp. 2266-2278
Authors:
Hsu, IC
Shih, WK
Lovchik, J
Wang, YH
Kong, D
Citation: Ic. Hsu et al., Mismatch cleavage detects pathogenic microorganisms, DIAGN MOL P, 9(3), 2000, pp. 172-176
Authors:
Chang, RI
Shih, WK
Chang, RC
Citation: Ri. Chang et al., Real-time disk scheduling for multimedia applications with deadline-modification-scan scheme, REAL-TIME S, 19(2), 2000, pp. 149-168
Authors:
Chindalore, G
Shih, WK
Jallepalli, S
Hareland, SA
Tasch, AF
Maziar, CM
Citation: G. Chindalore et al., An experimental study of the effect of quantization on the effective electrical oxide thickness in MOS electron and hole accumulation layers in heavily doped Si, IEEE DEVICE, 47(3), 2000, pp. 643-646
Authors:
Shih, WK
Hsu, WL
Citation: Wk. Shih et Wl. Hsu, A new planarity test, THEOR COMP, 223(1-2), 1999, pp. 179-191
Authors:
Mudanai, S
Chindalore, GL
Shih, WK
Wang, H
Ouyang, Q
Tasch, AF
Maziar, CM
Banerjee, SK
Citation: S. Mudanai et al., Models for electron and hole mobilities in MOS accumulation layers, IEEE DEVICE, 46(8), 1999, pp. 1749-1759
Authors:
Chindalore, G
Mudanai, S
Shih, WK
Tasch, AF
Maziar, CM
Citation: G. Chindalore et al., Temperature dependence characterization of effective electron and hole mobilities in the accumulation layers of N- and P-type MOSFET's, IEEE DEVICE, 46(6), 1999, pp. 1290-1294
Risultati:
1-7
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