Citation: D. Shilo et al., Comprehensive strain analysis in thin films based on high-resolution x-raydiffraction: Application to implanted LiNbO3 - art. no. 205420, PHYS REV B, 6320(20), 2001, pp. 5420
Citation: D. Shilo et al., Measurement of subtle strain modifications in heterostructures by using X-ray mapping in reciprocal space, J APPL CRYS, 34, 2001, pp. 715-721
Authors:
Berkowicz, E
Gershoni, D
Bahir, G
Lakin, E
Shilo, D
Zolotoyabko, E
Abare, AC
Denbaars, SP
Coldren, LA
Citation: E. Berkowicz et al., Measured and calculated radiative lifetime and optical absorption of InxGa1-xN/GaN quantum structures, PHYS REV B, 61(16), 2000, pp. 10994-11008
Authors:
Zolotoyabko, E
Shilo, D
Sauer, W
Pernot, E
Baruchel, J
Citation: E. Zolotoyabko et al., Stroboscopic x-ray topography in crystals under 10-mu m-surface acoustic wave excitation, REV SCI INS, 70(8), 1999, pp. 3341-3345
Authors:
Avrahami, Y
Shilo, D
Mainzer, N
Zolotoyabko, E
Citation: Y. Avrahami et al., Study of atomic diffusion in crystalline structures by high-resolution X-ray diffraction, J CRYST GR, 199, 1999, pp. 264-269