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Results: 2
Development of a secondary-electron detection system for high-speed high-sensitivity inspection SEM imaging
Authors:
Takafuji, A Nozoe, M Shinada, H
Citation:
A. Takafuji et al., Development of a secondary-electron detection system for high-speed high-sensitivity inspection SEM imaging, MICROEL ENG, 53(1-4), 2000, pp. 649-652
Tungsten Schottky emitters with reservoirs of metal oxide or nitride
Authors:
Nishiyama, H Ohshima, T Shinada, H
Citation:
H. Nishiyama et al., Tungsten Schottky emitters with reservoirs of metal oxide or nitride, APPL SURF S, 146(1-4), 1999, pp. 382-386
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