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Results: 1-5 |
Results: 5

Authors: Arkhipov, VA Antropov, VK Balalykin, NI Beloshitsky, PF Boer-Rookhuizen, H Brovko, OI Butenko, AB Fedorenko, SB Ivanov, IN Heine, E Heubers, WPJ Kaan, AP Kadyshevsky, VG Kalinichenko, VV Kobets, VV Krasavin, EA Kroes, FB Kuijer, LH Kulipanov, GN Laan, JBVD Langelaar, J Levichev, EB Louwrier, PWF Luijckx, G Maas, R Meshkov, IN Mezentsev, NA van Middelkoop, G Minashkin, V Morozov, NA Noomen, JG Polyakov, YA Russakovich, NA Sidorin, AO Sidorov, AI Sidorov, GI Sissakvan, AN Shakun, NG Shatunov, EM Shvets, VA Skrinsky, AN Smirnov, VI Sumbaev, AP Spelt, JB Syresin, EM Titkova, IV Tyutyunnikov, SI Ushakov, VA Vobly, PD Vodopyanov, AS Yurkov, MV
Citation: Va. Arkhipov et al., Project of the Dubna electron synchrotron, NUCL INST A, 470(1-2), 2001, pp. 1-6

Authors: Arkhipov, VA Antropov, VK Balalykin, NI Beloshitsky, PF Brovko, OI Butenko, AB Fedorenko, SB Ivanov, IN Kadyshevsky, VG Kalinichenko, VV Kobets, VV Krasavin, EA Meshkov, IN Minashkin, V Morozov, NA Polyakov, YA Russakovich, NA Sidorin, AO Sidorov, AI Sidorov, GI Sissakyan, AN Shakun, NG Shvets, VA Smirnov, VI Sumbaev, AP Syresin, EM Titkova, IV Tyutyunnikov, SI Vodopyanov, AS Yurkov, MV Boer-Rookhuizen, H Heine, E Heubers, WPJ Kaan, AP Kroes, FB Kuijer, LH Laan, JBVD Langelaar, J Louwrier, PWF Luijckx, G Maas, R van Middelkoop, G Noomen, JG Spelt, JB Kulipanov, GN Levichev, EB Mezentsev, NA Shatunov, EM Skrinsky, AN Ushakov, VA Vobly, PD Kolobanov, VN Mikhailin, VV
Citation: Va. Arkhipov et al., Project of the Dubna Electron Synchrotron, NUCL INST A, 467, 2001, pp. 59-62

Authors: Podchernyaeva, IA Lavrenko, VA Pasichnyi, VV Frolov, AA Shvets, VA
Citation: Ia. Podchernyaeva et al., Formation of graded structures under nigh-temperature oxidation conditionswith surface light-heat treatment, POWD MET ME, 39(3-4), 2000, pp. 210-213

Authors: Yakushev, MV Shvets, VA
Citation: Mv. Yakushev et Va. Shvets, Use of ellipsometric measurements for high-sensitivity monitoring of surface temperature, TECH PHYS L, 25(7), 1999, pp. 577-579

Authors: Pridachin, DN Yakushev, MV Sidorov, YG Shvets, VA
Citation: Dn. Pridachin et al., A study of tellurium adsorption processes on silicon by ellipsometry, RHEED and AES methods, APPL SURF S, 142(1-4), 1999, pp. 485-489
Risultati: 1-5 |